Product Description
Unlock dazzling precision in surface topography analysis with our top-notch Atomic Force Microscopy (AFM) system, now on Sale. Personalise your research experience with multiple scanning modes: Contact, Non-contact, and Tapping, all boasting sub-nanometer vertical resolution. Benefit from finest data output flexibility (analog & digital, proprietary + standard image formats), laser deflection feedback, and integrated analysis software. The robust structuremetal and high-grade polymer compositeensures durability, while active vibration isolation secures accurate results. Compatible with multiple cantilevers, supports samples up to 100 mm, and features USB 3.0/Ethernet connectivity. Powerfully engineered for Indias leading laboratories.
Commercial Application & Direction of Use
Atomic Force Microscopy (AFM) is widely supplied to commercial labs, universities, and institutes for nanotechnology research, biological sample study, and material science exploration. The instrument is handed over with integrated analysis software and active vibration isolation, making set-up seamless. To operate, position your sample (up to 100 mm diameter), select scanning mode, and monitor results on the high-resolution LCD display. Application is prominent in industries focusing on advanced materials, polymers, and bio-research.
Main Export & Domestic Markets, Supply Policy
Atomic Force Microscopy systems are regularly handed over to main export markets across Asia, Europe, and North America, as well as major domestic markets within India. Supply and transport services include careful packaging, documentation, and timely delivery. Sample policy ensures demonstration units are available for select industrial partners. Comprehensive customer support accompanies every shipment, ensuring smooth installation and operation for both research laboratories and production facilities.
FAQs of Atomic Force Microscopy - AFM:
Q: How can I personalise scanning modes on this Atomic Force Microscope?
A: You can customise your scanning mode by selecting Contact, Non-contact, or Tapping mode via the integrated analysis and control software. These options allow you to tailor measurements according to your samples properties and research needs.
Q: What are the main benefits of using sub-nanometer vertical resolution in AFM?
A: Sub-nanometer vertical resolution enables highly detailed topographical mapping of surfaces, crucial for nanotechnology research, materials characterization, and biological studies where minute structural variations significantly impact outcomes.
Q: Where can Atomic Force Microscopy be used most effectively?
A: AFM is most effective in research institutes, commercial laboratories, and industries involved in nanotechnology, material science, and biomedical engineering, providing high-precision surface measurements for diverse applications.
Q: What is the process for handing over and installing the AFM system?
A: Upon supply, the AFM system is handed over with complete documentation and user guidance. Installation involves setting up the active vibration isolation table, connecting the interface (USB 3.0 or Ethernet), and calibrating via integrated software.
Q: How does active vibration isolation enhance measurement accuracy?
A: Active vibration isolation reduces environmental noise below 0.5 nm RMS, ensuring that measurements remain stable and precise, particularly in settings where external vibrations could otherwise compromise data quality.
Q: When is demonstration or sample testing available for prospective buyers?
A: Demonstration and sample testing units are available according to the sample policy for institutional partners and key clients exploring instrument performance prior to full purchase or supply arrangement.
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