XPS Testing

XPS Testing

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Product Description

X-ray Photoelectron Spectroscopy [ XPS 
  •         Elemental composition of the surface (top 1-10 nm usually)
  •         Empirical formula of pure materials
  •         Elements that contaminate a surface
  •         Chemical or electronic state of each element in the surface
  •         Uniformity of elemental composition across the top surface (or line profiling
  •         or mapping)
  •         Uniformity of elemental composition as a function of ion beam etching (or
  •         depth profiling)
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